|
Results of Susceptibility Scan
Dark browns and reds show area of greatest sensitivity
SmartScan 300
SmartScan 600
|
The
SmartScan 300/600 series are
identify susceptibility problems and includes:
6KV pulse
generator for ESD susceptibility testing
Full 3
dimensional scanner table under software control
300 series – 310mm 4-axis scara robot
600 series – 600mm 4-axis scara robot
Automatic
failure detection
Fully automated DUT failure detection and power
cycle by software control. Any digital or analog signal is monitored
in real time
DUT location
camera - The scan area is edited directly on the DUT picture taken by
the camera. The software figures out the coordinates, and moves the
probe to the defined scan points
Probes
1mm and 5mm
Hx/y
D=8mm Hz
Field Probe
D=8mm Ez
Field Probe
Contact API for custom
design probes
Available Options
300/600 Series
include:
EMI
Scanning1
Current
Spreading Scan
Resonance
Scanning
Phase
measurement2
Phi3
axis control
On-site
installation and training
Contact API for other
custom design probes
1 Requires a Spectrum Analyzer
2 Requires an oscilloscope
3 Phi axis control adds the ability to control the probe orientation
during scanning for optimal resolution.
|
Susceptibility
scanners use a pulse generator specifically designed to produce a fast
rising pulse simulating the E and H fields produced by an ESD
(Electrostatic Discharge) event. The pulse is coupled via E and H field
probes and either manually or automatically scanned over the surface of
a suspect circuit. Once the susceptibility effect is localized, direct
injection probes and software analysis can be used to identify specific
IC pins or nodes that are the root cause of a susceptibility problem.
A
susceptibility test that can be done by both the system manufacturer and the
device manufacturer.
·
It’s a test that can be done by both
the system and device manufacturer – and the results are meaningful to both.
·
As a preventive measure during design or device selection, it provides the
engineer with a tool to see potential problems before a product is put into
production.
·
For resolving EMC susceptibility problems in a sub-assembly or finished
product, it provides a method to quickly see those areas likely to be the
root cause of upset or malfunction.
·
For the device manufacturer it’s an invaluable tool for determining the
sensitive of a device – something rarely done in industry today.
Susceptibility testing doesn’t replace system level testing to compliance
standards or device level testing for voltage withstand during handling.
What it will do is provide a tool that can be used by both the
system level manufacturer and the semiconductor manufacturer to identify
susceptibility problems at every level – device, board, sub-assembly and
system.
In addition to identifying a sensitive component or circuit, testing must be
able to quantify susceptibility levels and ideally correlate these results
with the system level test results. Simply doing a system level test on a
device is useless unless susceptibility levels can be determined and
quantified. |
