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Susceptibility & EMI Scanners
     

 

Manufactured and Serviced in Santa Clara, CA

SmartScan™ Immunity (Susceptibility) and EMI Scanners

 

 BASIC,  SmartScan,   SmartZap  &  PROFESSIONAL Models

 

Amber Precision Instruments of Santa Clara announces the world’s first fully automated immunity scanner for accurately pinpointing areas of system and device susceptibility to the effects of Electrostatic Discharge (ESD) and other electrical disturbances. By stimulating areas of a board or system and monitoring for system upset, SmartScanTM plots and displays sensitive areas including relative levels of sensitivity.

 

SmartScan is a diagnostic tool used at both the system and device level to rapidly identify potential susceptibility problems and provide the analysis required to develop a solution. Device manufacturers can for the first time, evaluate and qualify products resistance to upset and unwanted resets. Using a combination of E-field and H-field probes plus direct injection, sensitive areas are not only identified but quantified in terms of relative susceptibility.

 

Sophisticated software analysis provides a range of 3 dimensional color plots overlaying the actual device or board being tested. A complete range of options and potential upgrades are available for SmartScan that allow RF scanning, resonance scanning, multiple failure detections modules and of course, the ability to do full EMI scanning as well

 

Scanning can be used to compare devices from different manufactures to determine relative sensitivities.

PC Board remained the same, ICs are from two different manufacturers

 
     
 

In the design phase of a board, identify sensitivities due to poor circuit layouts

The sensitivity of this mother board would likely be improved by modifying the layout

 
     
 

A product that fails compliance testing can be quickly assessed and fixes put in place.

Eliminates the “Let’s try some ferrites and see if that helps” method of troubleshooting

Instead, the engineer knows exactly where to go and has some clues about what the appropriate fix might be

 
     

SmartScan BASIC

 

 

 

The BASIC is manually operated system for performing susceptibility scanning at the system level with minimal data storage capability.

 

SmartScan Basic 

 

 

 

Products

 

Tech Article

 

Overview

 

Brochure

 

 

SmartScan-Basic:

The BASIC is manually operated system for performing susceptibility scanning at the system level with minimal data storage capability. This system includes:

Up to 6kV pulse generator (occasional 8 kV use is allowed) for ESD susceptibility testing:

"A low cost manual ESD scanner. Users move the ESD probe by hands over a DUT for scan. Failure levels can be recorded by typing in by users. Pictures of probe positions at the failure location can be taken, and included in the record. More..." API's main hardware platform that most scan technologies can be integrated to this platform. 350 or 550 represents the four-axis robot arm size. 350 is a table top model, and 550 is a stand-alone model.

• Camera and camera shutter to take DUT pictures and failing spots.
• Manual input of failing location and failing condition over the DUT and separate table.
• Control computer.

ESD Probes:

• 2mm Hx/y Field Probe
• 5mm Hx/y Field Probe
• D=8mm Hz Field Probe
• D=8mm Ez Field Probe
• Contact API for custom probes

Available Options for the BASIC include:

  •  2nd camera to zoom in failure locations and probe positions

 

 

SmartScan 350/550

 


Table Top

 

Stand Alone

The SmartScan 350/550 series are identify susceptibility problems and includes:

  •  6KV pulse generator for ESD susceptibility testing

  •  Full 3 dimensional scanner table under software control

     

     

     

    Automatic failure detection

    Fully automated DUT failure detection and power cycle by software control. Any digital or analog signal is monitored in real time

    DUT location camera - The scan area is edited directly on the DUT picture taken by the camera. The software figures out the coordinates, and moves the probe to the defined scan points

     

    EMI

    Data

    ESD

    Data

     

API's near field scan solution is implemented using either a 350mm or 550mm 4 axis robot, offering precise control of probe landing points and high speed scan. SmartScan EMI supports standard test of IEC 61976-3 and following core features;
• Wide range of probe selection
 o EMI measurement from below 50 kHz to over 35 GHz
 - Low frequency probe set: 50 kHz ~ 50 MHz with 2mm probe dimension
 - Narrow band probes: GSM (860 MHz, 1950 MHz), WiFi (2400 MHz), etc.
 - Custom probes
• Integrated camera to take DUT pictures
 - Scan points (or areas) are defined over the DUT picture
 - Image stitching for larger DUT's
 - Scan results are displayed over the DUT picture automatically
• Layout file importing
 - ODB files can be imported, and scan points can be defined over the layout layer
• Flexible Scan Area Editor (SAE) module
 - Multiple scan areas with different scan resolutions
 - Points, lines, rectangles, any shape of scan area
• Automatic electrical X-Y offset correction
• Touch sensor to detect component heights
• Continuous run of multiple projects
• Flexible display options
 - 3D, multiple layer, cut-planes, histogram, merging multiple scan results to one display
• Customizable report generation in MS Word or Excel
• Matlab support
• Wizard to assist step by step scan condition set-up
• Optional emission scan technologies include
 o Field calculation
 o Phase measurement
 o Near field to far field transformation (available with phase measurement option)
 o Shielding effectiveness evaluation (SEE) package

 

 

 

SmartZap

 

 

 

http://www.amberpi.com/img/products_img/smartzap%20pro/smartzap_1.jpg

 

 

The SmartZap is a fully automated zap gun tester with automatic failure detection capability, providing far superior performance than manual zap gun test. It is complying IEC61000-4-2 standard.

 

Products

SmartZap Main Features:

Standard Features:
- Support of any ESD gun model
- Five sides zap (top and four sides)
- Automated failure detection
- Pick and placing
- Gun tip change (contact ←→ air)
- Connector plug/unplug
- DUT flipping
Standard Features:
- Customizable report generation
- Test point definition by graphic interface
- Test point definition by DUT CAD model
- Automatic DUT offset correction
- Key press and touch screen fingers
- Discharge brush
- IEC 61000 – 4 – 2 compliant zap table
- Pin test

 

 

 

 

 

     

 

 

 Last Updated: July 24, 2017

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An Electro Mechanical Research and Development (EMRAD) Corporation, Company

 
     
 

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